(1) GaInAsP/InP multiple-quantum-wire structures with the
wire widths of 18 nm and 27 nm in the period of 80 nm were
fabricated by electron beam lithography, CH4/H2-reactive ion
etching and two-step organometallic vapor-phase-epitaxial
growth. Size distributions of these quantum-wire structures
were measured by scanning electron microscope views and the
standard deviation was estimated to be less than ±2 nm. From
EL spectra at 103 K, the full-width at half maximum of these
quantum-wire structures was almost comparable to that of the
quantum-film structure fabricated from the same initial quantum-well.
(2) Wire width dependence of the large energy blue shift in
GaInAsP/InP partially strain-compensated vertically-stacked
multiple-quantum-wire structures is accurately explained for
the first time using an 8 band k・p theory without any fitting
parameter. Variations of energy levels due to a non-uniform
strain profile in stacked quantum-wires are calculated to
be less than 2.4 meV. It is found that unlike quantum films,
the energy-band structures of strained quantum-wires depend
on the amount of strain-compensation in barrier regions and
on the number of wire layers in the vertical stack.
(3) A RT-CW operation of GaInAsP/InP quantum-wire lasers (23
nm wide, 5 stacked quantum-wires) and wirelike lasers (43
nm wide, 5 stacked wires) fabricated by electron beam lithography,
CH4/H2-reactive ion etching and organometallic vapor-phase-epitaxial
regrowth was realized for the first time. Lifetime measurement
of this quantum-wire laser was also carried out at RT-CW condition,
and no noticeable performance degradation was observed even
after 9,500 hours.
(4) GaInAsP/InP strain-compensated 5-stacked compressively
strained quantum-wire lasers with the wire width of 14 nm
in the period of 80 nm were realized by electron beam lithography,
CH4/H2-reactive ion etching and organometallic vapor-phase-epitaxial
regrowth. By adopting completely strain-compensating barriers,
a smaller energy blue shift at the peak wavelength in EL spectra
than that in the case of a partial strain-compensation was
observed that indicates the suppression of the strain relaxation
effect during etching and InP regrowth process. Lateral quantum
confinement effect in this quantum-wire laser could be also
observed via sharper shape of the EL spectrum than that of
quantum-film lasers in the higher transition energy region.
(5) GaInAsP/InP multiple-quantum-wire lasers (wire widths
of 19 nm and 27 nm in a period of 100 nm) with SiO2/semiconductor
reflector by electron beam lithography, CH4/H2-reactive ion
etching and two-step organometallic vapor-phase-epitaxial
growth. As a result, oscillations from the ground levels could
be obtained at RT. In addition, the threshold current densities
of these quantum-wire lasers were lower than and differential
quantum efficiencies were comparable to those of quantum-film
lasers at RT.
(6) Low threshold operation of 1.55 mm
wavelength GaInAsP/InP strongly index-coupled and gain-matched
distributed feedback lasers with periodic wirelike active
regions, which was fabricated by electron beam lithography,
CH4/H2-reactive ion etching, and organometallic vapor-phase
epitaxial regrowth, were demonstrated and their reliability
was also investigated to date. As a result, no degradations
in lasing characteristics were observed after an aging time
of 8200 hours at a bias current of around 10 times the threshold.
In the experiment, all measured device of this laser oscillated
on the long-wavelength side of the stopband. We investigated
the single-mode operation of DFB laser with wirelike active
regions by using coupled-mode theory. As a result, it was
theoretically demonstrated that DFB lasers with wirelike active
regions oscillated in the long-wavelength side mode of the
stopband by considering the gain-matching effect. The facet
phases of two cleaved facets were also investigated. Lasing
modes exist on the long-wavelength side for any facet combination.
(7) We have been studying a new type of distributed reflector
laser consisting of a wirelike active section and a passive
DBR section with quantum-wire structure by using a lateral
quantum confinement effect. To evaluate the reflectivity of
the DBR, we fabricated Fabry-Perot type lasers with DBR section
on a single side. The reflectivity was estimated from the
output ratio from the front to the rear facet. The reflectivity
higher than 90 % was achieved at a DBR length of 200 mm
for the wire width of 60 nm and 350 mm
for 30 nm, where cleaved facet reflectivity of Rf = 0.3 and
the refractive index difference of Δn = 0.03 were assumed.
Using this DBR structure, DR laser was fabricated with planer
type structure by BCB polymer. As a result, threshold current
of 3.2 mA was obtained for active section length of 260 mm,
passive DBR section length of 130 mm
and stripe width of 4.3 mm with
both facets cleaved. The differential quantum efficiency from
the front facet was 19.2 % and the rear facet was 1.7 %, hence
an asymmetric output ratio of 11 was realized. A single-mode
operation with sub-mode suppression ratio (SMSR) of 46.6 dB
was achieved at a bias current of 3.75 times the threshold.
(8) The device mentioned above, however, could not operate
with high performance theoretically indicated. This result
was caused by damage of dry etching to form the stripe. For
higher efficiency, wet chemical etching was used to form the
laser stripe instead of dry etching. As a result of fabricating
the DR laser by wet chemical etching, threshold current of
2.5 mA, which corresponds to the threshold current density
of 189 A/cm2, was obtained for the active section length of
300 mm, the passive DBR section
length of 210 mm and the stripe
width of 4.4 mm. The active and
passive sections consist of 90-nm-wire with the period of
240.0 nm and 40-nm-wire with the period of 241.25 nm, respectively.
The differential quantum efficiency from the front facet was
35.6 % and the rear facet was 0.54 %. An asymmetric output
ratio of 66 was realized. A single-mode operation with sub-mode
suppression ratio (SMSR) of 53.7 dB was achieved at a bias
current of twice the threshold.
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(1) 1.3mm-wide narrow mesa stripe
DR lasers consisting of first-order vertical grating (VG)-DFB
and first-order deeply etched DBR mirrors were realized for
the first time by one-step epitaxy and fine vertical etching
processes. A threshold current of 2.8mA for the active region
length of 150mm and an SMSR=44dB
were obtained.
(2) In case of TE mode, a narrow stripe waveguide exhibits relatively
low coupling coefficient even for deep grating. 1.5mm
vertical grating distributed feedback lasers with tensile quantum
well were realized single mode operation of TM polarized VG-DFB
lasers. A threshold current of 2.6mA and SMSR=50dB were obtained.
(3) Novel semiconductor laser structure, such as, membrane laser
which has the Benzocyclobutene (BCB) cladding layers, enables
to increase optical confinement into active layer due to a large
refractive index difference between active layer and cladding
layers. A room temperature continuous wave operation of membrane
DFB laser consisting of deeply etched single-quantum-well wirelike
active regions was already demonstrated. In order to realize
single mode and low threshold operation of membrane DFB laser,
buried heterostructure (BH) was innovated by slightly changing
the fabrication process. A threshold pump power of 1.5 mW and
a sub-mode suppression-ratio of 42 dB were obtained for a 142
nm-thick semiconductor membrane core layer with a cavity length
of 120 mm and a stripe width of 2
mm under room-temperature continuous
wave optical pumping. The corresponding threshold for current
injection was roughly estimated to be 27 mA.
(4) We have realized membrane BH-DFB laser arrays by arranging
the laser cavities (10 mm spaced
15 elements with 5 different grating periods). A total wavelength
span of 72 nm was achieved with a small lasing wavelength fluctuation
of up to ±1.2 nm at RT-CW condition under optical pumping. From
this value, membrane thickness fluctuation was estimated to
be ±0.4 nm. Threshold pump power of 3.4 mW and SMSR of 45 dB
were achieved in a typical device.
(5) Membrane BH-DFB laser arrays with different grating periods
and different stripe width were successfully fabricated using
EB lithography, CH4/H2-RIE and OMVPE. The possibility for a
laser array covering a wide wavelength range of 51 nm with a
wavelength controllability of less than 0.8 nm (100GHz) was
demonstrated. This multi-wavelength laser array may be a candidate
for a coarse WDM system or a wavelength conversion device between
LAN and MAN.
(6) Low threshold operation of membrane buried heterostructure
distributed feedback (BH-DFB) laser arrays. 45 devices were
fabricated on a wafer covering a wide wavelength range of 75
nm. The lowest threshold pump power as low as 0.64 mW along
with the sub-mode suppression-ratio (SMSR) of over 30 dB at
2 times the threshold were successfully obtained at RT-CW condition.
(7) Phase shifted membrane BH-DFB laser with short cavity length
of 50 mm was fabricated and characterized.
Threshold pump power of 3.1mW and SMSR of 35dB were achieved
with RT-CW condition under optical pumping. Laser cavities were
operated under optical pumping at RT-CW using micro PL setup.
Stripe width was 2 mm, cavity length
was 50 mm, and grating period was
310 nm, respectively. Threshold pump power Pth was 3.1 mW which
corresponded to a threshold current Ith of around 70 mA
(estimated by assuming an absorption coefficient as 10000 cm-1).
An emission wavelength of 1549 nm was observed. Considering
the lasing mode as the Bragg wavelength, equivalent refractive
index was estimated to be around 2.50 which agreed well with
the value calculated from the cross sectional waveguide structure.
From the stop band width of 38 nm, index coupling coefficient
was estimated to be 710 cm-1.
(8) Benzosyclobutene (BCB) used for cladding layer of membrane
laser structure has negative temperature coefficient of refractive
index which is opposing value of semiconductor material. So
athermal waveguide can be designed with controlling the thickness
of membrane core layer. Membrane BH-DFB lasers with membrane
core thickness of 150nm and 65nm were fabricated. Slope of lasing
wavelength dependences on temperature were measured to be 0.0526nm/K
and 0.0245nm/K, respectively. The value for membrane thickness
of 65nm was one in five of typical semiconductor DFB lasers. |