LIST OF REPORT
Quantum-Film, Quantum-Wire, and Quantum-Box
Lasers
Journal Papers
1.
T. Kojima, H. Nakaya, S. Tanaka, H. Yasumoto,
S. Tamura and S. Arai, “Temperature Dependence of Internal Quantum Efficiency
of 20nm-Wide GaInAsP/InP Compressively Strained Quantum-Wire Lasers,” Jpn. J.
Appl. Phys., vol.38, no.1B pp.585-588, 1999.
2.
D. Lübbert, B. Jenichen, T. Baumbach, H. T. Grahn,
G. Paris, A. Mazuelas, T. Kojima and S. Arai, “Elastic Stress Relaxation in
GaInAsP Quantum Wires on InP,” J. Phys. D: Appl. Phys., vol.32, pp.A21-A25,
1999.
3.
N. Nunoya, M. Nakamura, H. Yasumoto, S. Tamura
and S. Arai, “Low Threshold GaInAsP/InP Distributed Feedback Lasers with
Periodic Wire Active Regions Fabricated by CH4/H2
Reactive Ion Etching,” Jpn. J. Appl. Phys., vol.38, no.11B, pp.L1323-L1326, 1999.
4.
T. Kojima, S. Tanaka, H. Yasumoto, S. Tamura
and S. Arai, “Evaluation of Optical Gain Properties of GaInAsP/InP
Compressively Strained Quantum-Wire Lasers,” Jpn. J. Appl. Phys., vol.38,
no.11A, pp. 6327-6334, 1999.
International Conferences
1.
N. Nunoya, M. Nakamura, T. Kojima, S. Tanaka,
S. Tamura and S. Arai, “Low Threshold Current Density (330A/cm2)
Operation of 1.55mm GaInAsP/InP MQW-DFB Lasers with Separated
Periodic Active Regions,” 16th Semiconductor Laser Symposium (29th precision
& Intelligence Lab. Symposium), 17, p.17, Yokohama (Japan), Mar. 1999.
2.
N. Nunoya, M. Nakamura, S. Tanaka, H.
Yasumoto, I. Fukushi, S. Tamura and S. Arai, “Low Damage GaInAsP/InP
Nano-Structures by CH4/H2 Reactive Ion Etching and Its
Application to Low Threshold Gain-Coupled DFB Lasers,” The 11th Int. Conf. on
Indium Phosphide and Related Materials (IPRM'99), TuB4-1, pp.349-352, Davos (Switzerland),
May 1999.
3.
N. Nunoya, M. Nakamura, T. Kojima, S. Tanaka,
H. Yasumoto, S. Tamura and S. Arai, “GaInAsP/InP Distributed Feedback Lasers
with Periodic Wire-like Active Region Fabricated by CH4/H2
Reactive-Ion-Etching,” The 3rd Pacific Rim Conf. on Lasers and Electro-Optics
(CLEO/PR'99), FU3, Seoul (Korea), pp.1291-1292, Sep. 1999.
4.
S. Arai, T. Kojima, M. M. Raj, N. Nunoya, S. Tanaka
and S. Toyoshima, “Long-Wavelength Lasers Prepared by Semiconductor
Microfabrication,” The 3rd Pacific Rim Conf. on Lasers and Electro-Optics
(CLEO/PR'99), FU4(Invited), pp.1293-1294, Seoul (Korea), Aug./Sep. 1999.
5.
N. Nunoya, M. Nakamura, H. Yasumoto, S. Tamura
and S. Arai, “GaInAsP/InP Multiple Layered Quantum-Wire Lasers Fabricated by CH4/H2
Reactive-Ion-Etching,” The 31st Int. Conf. on Solid State Devices and Materials
(SSDM'99), E-5-3, pp.276-277, Tokyo (Japan), Sep. 1999.
6.
S. Arai, T. Kojima, N. Nunoya, M.
Nakamura, H. Yasumoto, M. Morshed and S. Tamura, “GaInAsP/InP Quantum-Wire
Lasers,” The 4th Optoelectronics and Communications Conf. (OECC'99), C6S1-1(Invited),
pp.1294-1297, Beijing (China), Oct. 1999.
7.
M. Nakamura, N. Nunoya, H. Yasumoto, S Tamura
and S. Arai, “GaInAsP/InP High Index Coupled (ki=290
cm-1) DFB Laser with Periodic Wire-like Active Regions; The 4th
Optoelectronics and Communications Conf. (OECC'99), C6S5-4, pp.1454-1455. Beijing (China), Oct. 1999.
8.
S. Arai, N. Nunoya, M. Nakamura, H. Yasumoto
and S. Tamura, “1.5 mm Wavelength GaInAsP/InP Low
Threshold Current Lasers by Low-Damage CH4/H2-RIE and
OMVPE Regrowth,” Int. Symposium on Ultra-Parallel Optoelectronics (30th
Precision & Intelligence Lab. Symposium), C-2, pp.27-28, Kawasaki (Japan),
Mar. 2000.
9.
N.
Nunoya, M. Nakamura, H. Yasumoto, M. Morshed, K. Fukuda, S. Tamura, and S.
Arai, “1.5mm GaInAsP/InP
Double-Quantum-Well DFB Lasers with Deeply Etched Active Regions,” to be
presented at the 12th Int. Conf. on Indium Phosphide and Related Materials
(IPRM'00), TuA2, Williamsburg (Virginia, USA), May 2000.
10. H. Yasumoto, N. Nunoya, H.
Midorikawa, S. Tamura and S. Arai, “1.5mm
Wavelength Strain-Compensated GaInAsP/InP Wirelike Laser by CH4/H2
Reactive Ion Etching,” to be presented at the 12th Int. Conf. on Indium
Phosphide and Related Materials (IPRM'00), WA3, Williamsburg (Virginia, USA), May
2000.
Meeting Reports
1. N.
Nunoya, M. Nakamura, T. Kojima, S. Tanaka, H. Yasumoto S. Tamura and S. Arai, “GaInAsP/InP
Multiple Quantum Wire Lasers Fabricated by CH4/H2 Dry
Etching and Regrowth,” 「CH4/H2ドライエッチングと埋め込み再成長によるGaInAsP/InP多層量子細線レーザ」 Technical Report of IEICE, OPE99-44,
LQE99-38, pp.57-62, Tokyo (Japan), July 1999.
Domestic Conferences
1.
H. Yasumoto, T. Kojima, N. Nunoya, S. Tanaka
and S. Arai, “Temperature Dependences of 1.55mm
GaInAsP/InP Compressively-Strained MQW Lasers,” 「1.55mm波長帯GaInAsP/InP圧縮歪多重量子井戸レーザの温度特性」
Nat. Conv. Res. of Japan Soc. Appl. Phys., 28a-B-9, Digest III -p.1185, Noda, Mar.
1999.
2.
S. Tanaka, T. Kojima, H. Yasumoto, M. Morshed,
S. Tamura and S. Arai, “Fabrication of 1.55mm
GaInAsP/AlGaInAs Compressively-Straned Quantum-Wire Laser,” 「1.55mm帯GaInAsP/AlGaInAs圧縮歪量子細線レーザの作製」 Nat. Conv. Res. of Japan Soc. Appl. Phys., 28p-B-8, Digest III -p.1189,
Noda, Mar. 1999.
3.
N. Nunoya, M. Nakamura, S. Tanaka, H.
Yasumoto, S. Tamura and S. Arai, “GaInAsP/InP DFB Lasers Fabricated by CH4/H2-RIE
and OMVPE Regrowth,” 「CH4/H2-RIEとOMVPE 埋め込み再成長によるGaInAsP/InP
DFBレーザの作製」 Nat. Conv.
Res. of Japan Soc. Appl. Phys., 28p-B-10, Digest III -p.1189, Noda, Mar. 1999.
4.
N. Nunoya, M. Nakamura, T. Kojima, S. Tanaka,
I. Fukushi, S. Tamura and S. Arai, “GaInAsP/InP Multiple-Layered Quantum Wire
Lasers Fabricated by CH4/H2-RIE/ OMVPE Regrowth,” 「CH4/H2-RIE/OMVPE再成長法によるGaInAsP/InP多層量子細線レーザ」 Nat. Conv. Res. of Japan Soc. Appl. Phys., 29p-ZL-19, Digest III -p.1459,
Noda, Mar. 1999.
5.
M. Nakamura, N. Nunoya, H. Yasumoto, S. Tamura
and S. Arai, “Characteristics of High Index Coupled DFB Laser with Periodic
Wire-like Active Region,” 「強屈折率結合を有する活性層分離型DFBレーザの特性」 Nat. Conv. Res. of Japan
Soc. Appl. Phys., 3a-ZE-42, Digest III -p.980, Kobe, Sep. 1999.
6.
N. Nunoya, M. Nakamura, M. Morshed, H.
Yasumoto, S. Tamura and S. Arai, “GaInAsP/InP Multiple Layered Wire Structure
Laser,” 「GaInAsP/InP多層細線構造レーザの試作」 Nat. Conv. Res. of Japan
Soc. Appl. Phys., 3a-ZE-43, Digest III -p.981, Kobe, Sep. 1999.
7.
M. Nakamura, N. Nunoya, M. Morshed, H.
Yasumoto, S. Tamura and S. Arai, “Wire Wudtg Dependences of Threshold Current
for 2QW DFB Lasers with Wirelike Active Region,” 「活性層分離型2層DFBレーザのしきい値電流の細線幅依存性」 Nat. Conv. Res. of Japan Soc. Appl. Phys., 30p-N-1, Tokyo, Mar. 2000.
8.
N. Nunoya, M. Nakamura, K. Fukuda, M. Morshed,
S. Tamura and S. Arai, “Submilliampere Operation of BH-DFB Laser with Wirelike
Active Region,” 「活性層分離型DFBレーザのサブミリアンペア動作」 Nat. Conv. Res. of Japan
Soc. Appl. Phys., 30p-N-2, Tokyo, Mar. 2000.
9.
H. Yasumoto, N. Nunoya, H. Midorikawa, S.
Tamura and S. Arai, “Low Threshold Operation of Strain-Compensated GaInAsP/InP
Multiple-Layered Wire Laser,” 「GaInAsP/InP歪補償多層細線レーザの低しきい値動作」 Nat. Conv. Res. of Japan
Soc. Appl. Phys., 30p-N-11, Tokyo, Mar. 2000.
New Types of Semiconductor Lasers for Photonic Integration
Journal Papers
1.
M.
Madhan Raj, S. Toyoshima and S. Arai, “Multiple Micro-Cavity Laser with
Benzocyclobutene/Semiconductor High Reflective Mirrors Fabricated by CH4/H2-Reactive
Ion Etching,” Jpn.
J. Appl. Phys., vol.38,
pp.L811-L814, 1999.
2.
M.
Madhan Raj, J. Wiedmann, Y. Saka, H.
Yasumoto and S. Arai, “1.5 mm
Wavelength DBR Lasers Consisting of 3l/4-Semiconductor
and 3l/4-Groove Buried with Benzocyclobutene,” Elec. Lett., vol.35,
pp.1335-1337, 1999.
3.
M.
Madhan Raj, Y. Saka, J. Wiedmann, H.
Yasumoto and S. Arai, “Continuous Wave Operation of 1.55 mm
GaInAsP/InP Laser with Semiconductor /Benzocyclobutene Distributed Bragg
Reflector,” Jpn. J. Appl. Phys., vol.38, pp.L1240-L1242, 1999.
International
Conferences
1.
M.
Madhan Raj, S. Toyoshima and S. Arai, “Multiple
Micro-cavity Laser with l/4-Wide Deep Grooves Buried with Benzocyclobutene,” The 11th Int. Conf.
on Indium Phosphide and Related Materials (IPRM'99), TuB1-3, pp.207-210,
Davos (Switzerland), May 1999
2.
M.
Madhan Raj, J. Wiedmann, Y. Saka, H. Yasumoto, and S. Arai, “High Reflectivity Laser Facets by Deeply Etched DBR Buried
with Benzocyclobutene,” The 11th Int. Conf. on Indium Phosphide and Related Materials (IPRM'99),
PDA-3 (Post Deadline Papers), pp.10-11, Davos (Switzerland), May 1999.
3.
M.
Madhan Raj, J. Wiedmann, Y. Saka, K.
Ebihara, K. Matsui and S. Arai, “Highly Uniform 1.55mm
Wavelength Lasers with Deeply Etched Semiconductor/ Benzocyclobutene DBR,”
to be presented at the 12th Int.
Conf. on Indium Phosphide and Related Materials (IPRM'00), WP2, Williamsburg
(US), May 2000.
4.
M. Madhan Raj, S. Toyoshima and S.
Arai, ”Multiple Microcavity Laser with Benzocyclobutene(BCB)/Semiconductor High
Reflective Mirrors Fabricated by CH4/H2-RIE Dry Etching,”
16th
Semiconductor Laser Symposium, 5, pp.5, Yokohama, March 1999.
5.
M.
Madhan RAJ, Y. Saka, J. Wiedmann, S. Tamura and S. Arai, ”Low Threshold 1.5 mm Wavelength GaInAsP/InP
Lasers with Semiconductor/Benzocyclobutene
DBR Structure”, International Symposium on Ultra-Parallel Optoelectronics, P7,
pp.97-98, Kawasaki (Japan), February 2000.
1.
M.
Madhan Raj, S. Toyoshima, A. Matsutani, M. Oyake, Y. Saka and S. Arai, “Measurement
of CH4/H2-RIE Etched Mirror Roughness and Its Application
to Semiconductor Lasers,” 「CH4/H2-RIEエッチトミラーのラフネス測定と半導体レーザへの応用」
Nat. Conv. Res. of Japan Society of Applied
Phys.,
(28p-ZC-11), Tokyo, March 1999.
2.
S.
Toyoshima, M. Madhan Raj, M. Oyake and S. Arai, ”Multiple Microcavity Laser
with BCB/Semiconductor Reflectors by CH4/H2-RIE Dry
Etching,” 「CH4/H2ドライエッチングを用いたBCB/半導体反射鏡を有する多重極微共振器レーザ」
Nat.
Conv. Res. of Japan Society of Applied Phys.,
(28p-B-4), Tokyo, March 1999.
3.
Y.
Saka, M. Madhan Raj, J. Wiedmann, H. Yasumoto and S. Arai, ”Room
Temperature CW Operation of 1.54mm DBR
Laser with BCB /Semiconductor Reflectors,” 「BCB/半導体反射鏡を有する1.54mmDBRレーザの室温CW動作」Nat. Conv. Res. of Japan
Society of Applied Phys.,
(3a-ZE-40), Kobe, September 1999.
4.
J.
Wiedmann, M. Madhan Raj, Y. Saka, H. Yasumoto and S. Arai, ”Evaluation
of Reflectivity of Deeply Etched Semiconductor/BCB DBR Structure Lasers,” ”
「半導体/BCB DBR構造レーザーの反射率評価」Nat. Conv. Res. of Japan
Society of Applied Phys.,
(3a-ZE-41), Kobe, September 1999.
5.
M.
Madhan Raj, Y. Saka, K. Ebihara and S. Arai, “Low Threshold and High Efficiency
Operation of 1.5mm Wavelength Semiconductor/BCB
DBR Lasers,” 「1.5mm波長帯半導体/BCB DBRレーザの低しきい値・高効率動作」Nat. Conv. Res. of Japan Society of Applied Phys., (30p-N-8), Tokyo, March
2000.
6.
J.
Wiedmann, M. Madhan Raj, Y. Saka, S. Tamura and S. Arai, “Single-Mode Operation
of Deeply Etched DBR Lasers with Multiple-Cavities,” 「多重共振器を有するDBRレーザの単一波長動作」Nat. Conv. Res. of Japan
Society of Applied Phys.,
(30p-N-9), Tokyo, March 2000.
7.
Y.
Saka, K. Ebihara, M. Madhan Raj, J. Wiedmann and S. Arai, “Double Sided DBR
Laser with BCB/Semiconductor Bragg Reflector,” 「両端にBCB/半導体反射鏡を有するDBRレーザ」Nat. Conv. Res. of Japan Society of Applied Phys., (30p-N-10), Tokyo, March
2000.
Quantum
Coherent Electron Devices
Journal
Papers
1.
N.
Machida and K. Furuya, “Analysis of Phase-Breaking Effects in Triple-Barrier
Resonant-Tunneling Diodes”, Jpn. J. Appl. Phys., Vol. 38, Part 1, No. 7A, pp.4017-4020,
1999.
2.
N.
Machida and K. Furuya, “Analysis of Electron Incoherence Effects in Solid-State
Biprism Devices”, Physica B, Vol. 272, pp.82-84, 1999.
3.
L.
E. Wernersson, M. Suhara, N .Carlsson, K. Furuya, B. Gustafson, A. Litwin, L. Samuelson
and W. Seifert, “Lateral Confinement in a Resonant Tunneling Transistor with a
Buried Metallic Gate”, Appl. Phys. Lett., vol.74, no.2, pp.311-313, 1999.
4.
M.
Suhara, L. E. Wernersson, B. Gustafson, N .Carlsson, W. Seifert, A. Gustafson,
J. O. Malm, A. Litwin, L. Samuelson and K. Furuya, “Gated Tunneling Structures
with Buried Tungsten Grating Adjacent to Semiconductor Heterostructures”, Jpn.J.Appl.Phys., Vol. 38, No. 6A, pp.3466-3469, 1999.
5.
Y. Miyamoto, H. Tobita, K. Oshima,
and K. Furuya, "Barrier Thickness Dependence of Peak Current Density in
GaInAs/AlAs/InP Resonant Tunneling Diodes by MOVPE," Solid-State
Electronics, vol.43, pp.1395-1398, 1999.
6.
N.
Kikegawa, B. Y. Zhang, Y. Ikeda, N. Sakai, K. Furuya, M. Asada, M.
Wanatabe and W. Saito, “Shortening
of Detection Time for Observation of Hot Electron Spatial Distribution by
Scanning Hot Electron Microscopy”, Jpn. J. Appl. Phys., Vol. 38, Part 1, No.
4A, pp.2108-2113,1999.
7.
B.
Y. Zhang, Y. Ikeda, K. Furuya and N. Kikegawa, “Comparison between Fermi-Dirac
and Boltzmann Methods for Band-bending Calculations of Si/CaF2/Au
Hot Electron Emitter”, Jpn. J. Appl. Phys., Vol. 38, Part 1, No. 4A,
pp.1905-1908,1999.
8.
B.
Y. Zhang, K. Furuya, Y. Ikeda and N. Kikegawa, “Design and Experimental
Characteristics of n-Si/CaF2/Au Hot Electron Emitter for Use in
Scanning Hot Electron Microscopy”, Jpn. J. Appl. Phys., Vol. 38, Part 1, No. 8,
pp.4887-4892, 1999.
9.
B.
Y. Zhang, K. Furuya, Y. Ikeda, N. Kikegawa, M. Watanabe and T. Maruyama, “Theoretical and Experimental
Characterizations of Hot Electron Emission of n-Si/CaF2/Au Emitter
Used in Hot Electron Detection Experiment”, Physica B, Vol. 272, pp.425-427,
1999.
International
Conferences
1.
N.
Machida and K. Furuya, “Analysis of Electron Coherence Effects in Solid-State
Biprism Devices”, The 11th International Conference on Nonequilibrium Carrier
Dynamics in Semiconductors (HCIS-11), MoP-21, p 57, Kyoto, Japan, July 19-23, 1999.
2.
B.
Gustafson, M. Suhara, K. Furuya, L. Samuelson, W. Seifert, and L. E. Wernersson,
“Lateral Quantum Confinement in Selectively Grown Resonant Tunneling Transistor
with an Embedded Gate”, The 9th International Conference on Modulated
Semiconductor Structures (MSS9), G09, p128, Fukuoka, Japan, July 12-16, 1999.
3.
M.
Suhara, L. –E. Wernersson, B. Gustafson, W. Seifert, L. Samuelson, and K.
Furuya, “A Study of the Regrown Semiconductor Interface Including Patterned
Metal Using Resonant Tunneling Structures Fabricated in the Overgrowth Process”,
7th International Conference on the Formation of Semiconductor Interfaces
(ICFSI7), 0Fr02, Goethenberg, June, 1999.
4.
B.
Y. Zhang, Y. Ikeda, Y. Miyamoto, K. Furuya, and N. Kikegawa, “A Versatile Hot
Electron Emitter of InGaAs/AlAs Heterostructure with Wide Energy Range at High
Current Density”, The 9th International Conference on Modulated Semiconductor
Structures (MSS9), N13, p279, Fukuoka, Japan, July 12-16, 1999.
5.
B.
Y. Zhang, K. Furuya, Y. Ikeda, N. Kikegawa, M. Watanabe and T. Maruyama, “Theoretical
and Experimental Characterizations of Hot Electron Emission of n-Si/CaF2/Au
Emitter Used in Hot Electron Detection Experiment”, The 11th International
Conference on Nonequilibrium Carrier Dynamics in Semiconductors (HCIS-11),
ThP-18, p182, Kyoto, Japan, July 19-23, 1999.
Meeting
Report
1.
M.
Suhara, L. E. Wernersson, B. Gustafson, W. Seifert, L. Samuelson and K. Furuya,
“Control of Resonant Tunneling Current due to Buried Fine Metal Adjacent to
Semiconductor Heterostructures,” 「半導体ヘテロ接合に隣接した埋め込み微細金属による共鳴トンネル電流の制御」Technical
Report of IEICE, ED99-9, pp.53-58, 1999.
Domestic
Conferences
1.
N. Machida, K. Furuya and T. Konishi, “Design for
Solid-State Biprism: Proposal of a Detection Method for Electron Interference
Fringes”, 「固体バイプリズムの設計:電子波干渉縞検出法の提案」,
Nat. Conv. Res. of Japan Soc. Appl. Phys., 28p-Y-4,
Chiba, Mar. 1999.
2.
T. Konishi, N. Machdia and K. Furuya,
“Proposal for a Solid-State Lens for Electron Wave with Fine-Metal Wires Buried
in Semiconductors", 「半導体中埋め込み金属細線を用いた固体中電子波レンズの提案」, Nat. Conv. Rec. of Japan Soc. Appl. Phys., 2a-P4-6, Kobe, Sep. 1999.
3.
N. Machida, M. Kurahashi and K.
Furuya, "Device Design for Solid-State Biprism: Proposal for a Structure
with p-type Semiconductor/W Junction", 「固体バイプリズムの設計:p型半導体/W接合を用いたデバイス構造の提案」, Nat.
Conv. Rec. of Japan Soc. Appl. Phys., 2a-P4-7, Kobe,
Sep. 1999.
4.
B.
Y. Zhang, Y. Ikeda, N. Kikegawa and K. Furuya, “Quantum Mechanical Effect on
Potential Barrier Height and Transmission Probability in n+-Si/CaF2/Au
Hot Electron Emitter”, Nat. Conv. Res. of Japan Soc. Appl. Phys., 28a-Y-4,
Noda, Mar. 1999.
5.
N.
Sakai, N. Kikegawa, K. Furuya, B. Y. Zhang, Y. Ikeda, "Spatial Resolution
of Scanning
Hot Electron Microscope - 3D Potential Analysis", 「走査型ホットエレクトロン顕微鏡の分解能評価−3次元ポテンシャル解析−」, Nat. Conv. Rec. of Japan Soc.
Appl. Phys., 29p-H-1, Noda, Mar. 1999.
6.
N.
Kikegawa, B. Y. Zhang, Y. Ikeda, N. Sakai, K. Furuya, "Multipoint
Detection toward Scanning Hot Electron Microscopy (SHEM)",「走査型ホットエレクトロン顕微鏡(SHEM)に向けた多点ホットエレクトロン測定」, Nat.
Conv. Rec. of Japan Soc. Appl. Phys., 29p-H-2, Noda, Mar.1999.
7.
N.
Sakai, B. Y. Zhang, S. Karasawa, K. Furuya, "Development of SHEM for
Measurement of HE Spatial Distribution - Noise Characteristics ", 「HE空間分布測定に向けたSHEMの開発−ノイズ特性−」, Nat. Conv. Rec. of Japan Soc. Appl.
Phys., 2p-ZK-8, Kobe, Sep.1999.
8.
M. Nagase, M. Shioyama, M.Suhara, Y.Miyamoto and
K.Furuya, “Analysis of I-V Characteristics of Triple-Barrier Resonant Tunneling
Diodes -Temperature Dependence-”, 「3重障壁共鳴トンネルダイオードの電流電圧特性解析‐温度依存性‐」, Nat. Conv. Res. of Japan Soc.
Appl. Phys., 28a-Y-3, Noda, Mar. 1999.
9.
M.
Suhara, L. E. Wernersson, B. Gustafson, W. Seifert, L. Samuelson and K. Furuya,
“Control of Tunnel Current by Using a Buried Tungsten Grating,”, 「埋込みタングステン‐グレーティングを用いたトンネルバリアの制御」, Nat.
Conv. Rec. of Japan Soc. Appl. Phys., 28a-Y-5, Noda, Mar. 1999.
10.
K. Sato, S. Karasawa, M. Suhara, Y.
Miyamoto and K. Furuya, "Estimation of Transport Characteristics of Si
Delta-Doping on InP Monolayer Steps Grown by OMVPE", 「OMVPE成長InP単原子ステップへのSiδドーピング層における導電特性の評価」, Nat. Conv. Rec. of Japan Soc. Appl. Phys., 28p-Y-14, Noda,
Mar. 1999.
11.
M. Nagase and K.Furuya, "Estimation
Accuracy of Resonant Energy Widths Using a Triple-Barrier Resonant Tunnling
Diode", 「3重障壁共鳴トンネルダイオードを用いた共鳴準位幅の評価精度」, Nat. Conv. Rec. of Japan
Soc. Appl. Phys., 1a-P2-12, Kobe, Sep.1999.
High-Speed Electron Devices Using Advanced
Structures and Materials
Journal Papers
1.
W.Saitoh, A.Itoh, S.Yamagami, and M.Asada,
"Analysis of Short-Channel Schottky
Source/Drain Metal-Oxide-Semiconductor Field-Effect Transistor on
Silicon-on-Insulator Substrate and Demonstration of sub-50nm n-type Devices with Metal Gate", Jpn. J. Appl.
Phys., Vol. 38, No. 11, pp. 6226-6231, 1999.
2.
M.Tsutsui, M.Watanabe, and M.Asada:
"Resonant Tunneling Diodes in Si/CaF2 Heterostructures Grown by Molecular Beam
Epitaxy", Jpn. J. Appl. Phys., Vol. 38, No. 8B, pp. L920-L922, 1999.
3.
W.Saitoh, S.Yamagami, A.Itoh, and M.Asada,
"35nm Metal Gate p-type Metal Oxide Semiconductor Field-Effect Transistor
with PtSi Schottky Source/Drain on Separation by Implanted Oxygen
Substrate", Jpn.J.Appl.Phys., Vol. 38, No. 6A, pp. L629-L631, 1999.
4.
Y.Oguma, N.Sashinaka, and M.Asada,
"Terahertz Response with Gradual Change from Square-Law Detection to
Photon-Assisted Tunneling in Triple-Barrier Resonant Tunneling Diodes",
Jpn.J.Appl.Phys., Vol. 38, No. 7A, pp. L717-L719, 1999.
International Conference
1.
T. Arai, H. Tobita, Y. Harada, M. Suhara, Y. Miyamoto
and K. Furuya, “Proposal of Buried Metal Heterojunction Bipolar Transistor and
Fabrication of HBT with Buried Tungsten” International Conference on Indium
Phosphide and Related Materials, TuA1-4, Davos (Switzerland), May 16-20, 1999.
2.
M.Asada, Y.Oguma, and N.Sashinaka,
"Estimation of THz Gain due to Interwell Transition by the Measurement of
Detection Properties of Triple-Barrier Resonant Tunneling Diodes"
(Invited), Int. Conf. on Nonequilibrium Carrier Dynamics in Semiconductors
(HCIS-11), MoB-1, Kyoto (July 1999).
3.
W.Saitoh, A.Itoh, S.Yamagami, and M.Asada,
"Demonstration of sub 50nm Gate n-type Schottky Source/Drain
MOSFETs", Int. Conf. on Nonequilibrium Carrier Dynamics in Semiconductors
(HCIS-11), TuC-3, Kyoto (July 1999).
4.
M.Tsutsui, M.Watanabe and M.Asada,
"Observation of Negative Differential Resistance in Si/CaF2
Resonant Tunneling Diodes", Silicon Nanoelectronics Workshop, S3-6, Kyoto
(June 1999).
5.
Y.Oguma, N.Sashinaka, and M.Asada,
"Observation of Gradual Change from Square-Law Detection to
Photon-Assisted Tunneling in THz Response of Triple-Barrier Resonant Tunneling
Diodes", Int. Conf. on Modulated Semiconductor Structures (MSS9), G03,
Fukuoka (July 1999).
6.
W.Saitoh, S.Yamagami, A.Itoh, and M.Asada,
"35nm metal gate SOI-p-MOS-FETs with PtSi Schottky Source/Drain",
Annual Device Research Conference (DRC'99), II-A-6, Santa Barbara, CA/USA (June
1999).
Meeting Report
1.
W.Saitoh, S.Yamagami, A.Itoh and M.Asada, “Demonstration
of sub 50nm Gate Schottky Source/Drain MOSFETs”, 「SOI基板上サブ50nm金属ゲートSchottky
Source/Drain MOSFET」,
Technical report of IEICE, ED99-26, Yamaguchi, April 1999.
2.
T. Arai, Y. Harada, H. Tobita, Y. Miyamoto and
K. Furuya, “Fabrication of HBT with Buried Tungsten Mesh Used as a Collector
Electrode” 「埋め込みタングステンメッシュをコレクタ電極として使用したHBTの作製」, Technical report of IEICE, ED99-196, Oct.
21, 1999.
Domestic Conferences
1.
W.Saitoh, S.Yamagami, A.Itoh and M.Asada,
"35nm Metal Gate p-type Schottky MOSFET on SIMOX Substrate", 「SIMOX基板上
35nm金属ゲートp型 Schottky MOSFETの作製」,
Nat. Conv. Rec. of Japan Soc. Appl. Phys., 30p-ZM-13, Noda Mar. 1999.
2.
A.Itoh, W.Saitoh, S.Yamagami and M.Asada,
"Analysis of Short Channel Schottky MOSFET on SOI Substrate and
Fabrication of n-type Devices", 「SOI基板上 短チャネルSchottky
MOSFETの特性解析とn形素子の作製」, Nat. Conv. Rec. of Japan Soc. Appl. Phys.,
30p-ZM-14, Noda Mar. 1999.
3.
Y.Oguma, N.Sashinaka, W.Saitoh and M.Asada,
"Observation of THz Rectification of the Triple-Barrier Resonant Tunneling
Diode", 「三重障壁共鳴トンネルダイオードにおけるTHz検波出力特性の観測」, Nat. Conv. Rec. of Japan Soc. Appl. Phys.,
30a-Y-10, Noda Mar. 1999.
4.
T. Arai, H. Tobita, Y. Harada, M. Suhara, Y.
Miyamoto and K. Furuya, “Fabrication of HBT with Buried Tungsten Mesh as
Collector Electrode” 「埋め込みタングステンメッシュをコレクタ電極として使用したHBTの作製」 Nat. Conv. Rec. of The Japan Soc. Appl.
Phys., 31a-P11-8, Noda Mar. 1999.
5.
M.Tsutsui, M.Watanabe and M.Asada,
"Fabrication and Characteristics of Resonant Tunneling Diodes with Si/CaF2
Heterostructures", 「Si/CaF2ヘテロ構造共鳴トンネルダイオードの作製と評価」, Nat.
Conv. Rec. of Japan Soc. Appl. Phys., 2p-ZL-9, Kobe Sep. 1999.
6.
M.Asada, Y.Oguma and N.Sashinaka,
"Terahertz Gain Due to Interwell Transition Estimated by the Detection
Properties of Resonant Tunneling Diodes", 「共鳴トンネルダイオードの検波特性から見積もった隣接量子井戸間遷移によるテラヘルツ利得」,
Nat. Conv. Rec. of Japan Soc. Appl. Phys., 1a-p2-6, Kobe Sep. 1999.
7.
Y.Iketani, M.Watanabe and M.Asada, "Ion
Beam Epitaxial Growth of CaF2 on Si(111) 1°off Substrate with Controlled
Terrace-Width", 「テラス幅を制御したSi(111)1度off基板上へのCaF2イオンビームエピタキシャル成長」, Nat. Conv. Rec. of Japan
Soc. Appl. Phys., 1p-T-4, Kobe Sep. 1999.
8.
Y. Harada, T. Arai, S. Yamagami, Y. Miyamoto
and K. Furuya, “Fabrication and DC Characteristics of GaInAs/InP-Based HBT with
20 nm Thick InP Emitter Layer” 「エミッタ層厚20nmのGaInAs/InP系HBTの作製と直流動作特性」 Nat. Conv. Rec. of The Japan Soc. Appl.
Phys., 1a-ZF-8, Kobe Sept. 1999.
Light Emitting Devices Using Advanced Structures
and Materials
Journal of Papers
1.
M.
Watanabe, Y. Aoki, W. Saitoh and M. Tsuganezawa, "Negative Differential
Resistance of CdF2/CaF2 Resonant Tunneling Diode on
Si(111) Grown by Partially Ionized Beam Epitaxy," Jpn. J. Appl. Phys., 38, 2A, pp.L116-L118, 1999.
2.
M.
Watanabe, T. Maruyama, S. Ikeda, "Light Emission from Si Nanocrystals
Embedded in CaF2 Epilayers on Si(111): Effect of Rapid Thermal
Annealing," J. Luminescence, 80,
pp.253-256, 1999.
3.
T.
Maruyama, N. Nakamura, and M. Watanabe, "Visible Electroluminescence from
Nanocrystalline Silicon Embedded in Single-Crystalline CaF2/Si(111)
with Rapid Thermal Anneal," Jpn. J. Appl. Phys., 38, 8B, pp. L904-L906, 1999.
4.
T.
Maruyama, N. Nakamura, and M. Watanabe, "Improvement of the Visible
Electroluminescence from Nanocrystalline Silicon Embedded in CaF2 on
Si(111) Substrate Prepared by Rapid Thermal Annealling," Jpn. J. Appl.
Phys., 39, 4B, 2000.
International Conferences
1.
M.
Watanabe, Y. Maeda, S. Okano, “Epitaxial Growth and UV Luminescence of CaF2/ZnO/CaF2
Heterostructures on Si(111),” 41st Electronic Materials Conference, T5, pp.51-51,
Santa Barbara, U.S.A., June 30-July 2, 1999.
2.
T.
Maruyama, N. Nakamura, and M. Watanabe, “Visible Electroluninescence from Silicon
Nanocrystals Embeded in CaF2 Epilayers on Si(111) with Rapid Thermal
Anneal,” The 1999 International Conference on Solid State Devices and Materials,
D-11-1, pp.426-427, Tokyo, Sept. 21-24, 1999.
Meeting Report
1.
M. Watanabe, M. Tsutsui, and M. Asada, “Resonant
Tunneling Diode Silicon Substrate Using Si-CaF2 and CdF2-CaF2
Heterostructures,” 「Si-CaF2及びCdF2-CaF2ヘテロ接合を用いたシリコン基板上共鳴トンネルダイオード」,
Technical report of IEICE, ED99-316, Sapporo, Feb. 2000.
Domestic Conferences
Journal Papers
1.
N. Nunoya, M. Nakamura, M. Tamura
and S. Arai, “Characterization of Etching Damage in Cl2/H2-Reactive-Ion-Etching
of GaInAs/InP Heterostructure,” Jpn. J. Appl. Phys., vol.38, no.12A, pp.6942-6946,
1999.
1.
Y. Miyamoto, A. Kokubo, H. Oguchi, M.
Kurahashi and K. Furuya, “Anomalous Current in 50nm width Au/Cr/GaInAs
Electrode for Electoron Wave Interference Device”, Third International
Symposium on Control of Semiconductor Interfaces, A5-6, Karuizawa (Japan), Oct.
25-29, 1999.
2.
T. Arai, H. Tobita, Y. Harada, M. Suhara, Y. Miyamoto
and K. Furuya, “Toward Nano-Metal Buried in InP Structure - 20 nm Wide Tungsten
Wire and InP Buried Growth of Tungsten -”, The 9th International Conference on Modulated
Semiconductor Structures, D21, Fukuoka (Japan), July 12-16, 1999.
Domestic Conferences
1. M.
Nakamura, N. Nunoya, I. Fukushi, S. Tamura and S. Arai, “CH4/H2
Dry Etching/ OMVPE Regrowth for GaInAsP/InP Low-Dimensional Quantum-Well
Structures,” 「GaInAsP/InP
低次元量子井戸構造のためのCH4/H2ドライエッチング/埋め込み再成長」 Nat. Conv. Res. of Japan
Soc. Appl. Phys., 28p-ZC-9, Digest III -p.1189, Noda, Mar. 1999.
2. H.
Oguchi, K. Sato, Y. Miyamoto and K. Furuya, “Contact Characteristics in 80nm
Period Electrode on GaInAs for Electron Wave Interference Device”, 「電子波干渉素子用 GaInAs上80nm周期電極の特性」, Nat. Conv. Rec. of Japan Soc. Appl. Phys.,
2a-P4-5, Kobe, Sep. 1999.